Intelligent Metrology Systems
Welcome to the Lab for Intelligent Metrology Systems at the University of Cincinnati. Our lab is devoted to advancing multidisciplinary research that converges data science with cutting-edge sensing and metrology technologies. Our goal is to propel the next generation of metrology systems with enhanced intelligence and autonomy. Our primary focus lies in the realms of smart manufacturing and biomedical applications, where we strive to push the boundaries of innovation.
Featured
Featured
Semiconductor Manufacturing | Wafer Map | Smart Manufacturing | Dynamic Clustering | Rotation-Invariant Feature Extraction
Semiconductor Manufacturing | Quality Control | Smart Manufacturing | Chemical Mechanical Polishing
Fault Detection and Diagnosis | Quality Control | Intelligent Systems | Smart Manufacturing