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Artificial Intelligence to Advance High-Mix Production: A Roadmap for the Semiconductor Industry

Dec 26
Written by Jia Xiaodong
Full Report
Report Cover.jpg NIST-AI Roadmap-Semiconductor_Final.jpg
Jia Xiaodong
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Cross-Chamber Transfer learning at the Trace Level for Improved FDC Accuracy

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A Novel Method in Intelligent Synthetic Data Creation for Machine Learning-based Manufacturing Quality Control

Center for Intelligent Metrology & Sensing
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University of Cincinnati
Cincinnati, OH 45221