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Adaptive virtual metrology for semiconductor chemical mechanical planarization process using GMDH-type polynomial neural networks
Jia Xiaodong 3/19/24 Jia Xiaodong 3/19/24

Adaptive virtual metrology for semiconductor chemical mechanical planarization process using GMDH-type polynomial neural networks

Semiconductor Manufacturing | Quality Control | Smart Manufacturing | Chemical Mechanical Polishing

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Center for Intelligent Metrology & Sensing
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University of Cincinnati
Cincinnati, OH 45221